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(Hardback)
By: George W. Zobrist
ISBN: 9780893917814
Readership/Audience: Tertiary Education
Publication Date: May 1993
Publisher: Bloomsbury Publishing PLC
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This text explores VLSI fault modelling and testing techniques and covers such topics as: physical fault modelling and simulation for VSLI MOS circuits; designing CMOS gates to test open faults; testing bridging faults in VLSI; and testable design synthesis models.
