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Invention Analysis and Claiming: A Patent Lawyer's Guide, Third Edition

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Publishing Details

Full Title:

Invention Analysis and Claiming: A Patent Lawyer's Guide, Third Edition

Contributors:

By (Author) Ronald D. Slusky

ISBN:

9781639056125

Publisher:

American Bar Association

Imprint:

American Bar Association

Publication Date:

1st October 2025

Country:

United States

Classifications

Readership:

General

Fiction/Non-fiction:

Non Fiction

Main Subject:
Other Subjects:

Intellectual property law
Legal skills and practice

Dewey:

346.730486

Physical Properties

Physical Format:

Paperback

Number of Pages:

488

Dimensions:

Width 177mm, Height 254mm

Description

Invention Analysis and Claiming: A Patent Lawyer's Guide, Third Edition's teachings are grounded in "old school" principles of patent practice that, before now, have been learned only on the job from supervisors and mentors. In addition, a new chapter is devoted to means-plus-function claiming--explaining its history, how the Federal Circuit case law has dramatically affected the practice in this realm, and how the patent practitioner can secure appropriately broad coverage for the inventive concept while not triggering "means-plus-function treatment."

Questions at the end of each chapter have been added to:

  • Confirm the understanding of the principles presented;
  • Explore the jurisprudential and practical implications of those principles; and
  • Try out the invention analysis and claim drafting skills taught in the chapter

Author Bio

Ronald D. Slusky has been a patent professional for thirty five years and is currently in private practice in New York City. For thirteen of his thirty years at Bell Labs, he was in patent management, supervising and mentoring small and large groups of patent attorneys. Mr. Slusky is the author of several instructional booklets and is the co-author of a chapter in Advances in Image Pickup Density (Academic Press, 1981). He has a B.S. and an M.S. in electrical engineering from Columbia University, a J.D. from Seton Hall University and is admitted to practice in New Jersey and the U.S. Patent and Trademark Office.

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